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Abstract
Rare-earth (RE) ions-doped oxyfluoride transparent glass-ceramics containing nanocrystalline phases with very low phonon energies like LaF
3, NaLaF
4 and KLaF
4 combine the superior optical performance of low phonon energy phases with the high mechanical, chemical and thermal stability of oxide silicates. The insertion of the doping RE ions in the fluoride nanocrystals enhances the radiative optical emission processes currently focused on up- and down-conversion emissions. Thus, a key point is to identify and quantify the RE ions in the fluoride nano-crystals. In this contribution an oxyfluoride glass and the corresponding glass-ceramics of composition 55 SiO
2. 20 Al
2O
3.15 Na
2O.10 LaF
3 mol % doped with 1 mol % Tm
2O
3 is presented. The Tm
3+ incorporation in the precipitated LaF
3 nano-crystals has been analysed by two different techniques. Firstly, TEM and Energy Dispersive X-Ray Spectroscopy (EDXS) were used to perform elemental distribution mappings of RE elements that allow to directly localising RE ions in the glass and glass-ceramics. Additionally, X-ray absorption spectroscopy (XAS) measurements were performed to analyse the distribution and first coordination sphere of Tm
3+ ions in the glass and glass–ceramics by using Xray absorption near edge structure spectroscopy (XANES) and extended absorption X-ray fine structure spectroscopy (EXAFS), which have allow to quantify the Tm
3+ incorporation in the LaF3 nano-crystals.